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D. G. Filatova, N. A. Alov, P. Yu. Marikutsa, I. F. Seregina

Ruthenium and palladium determination in tin oxide based advanced materials by mass spectrometry with inductively coupled plasma and total reflection X-ray fluorescence

Abstract

The technique ofmicrowave decompositionof the samplesin a mixture ofacids is developed. Themetrological characteristics of the determination are calculated.
Key words: ICP-MS, TXRF, semiconductors materials, ruthenium , palladium, tin dioxide.
Moscow University Chemistry Bulletin.
2015, Vol. 56, No. 5, P. 292 		   
Copyright (C) Chemistry Dept., Moscow State University, 2002
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